- Model: FEI Quanta 3D FEG Scanning Electron Microscope with Focused Ion Beam (FIB) Cross Sectioning Capability
- Year of Manufacture: 2008 (fully repaired and recommissioned by ThermoFisher in 2021, with FEG electron source replaced by ThermoFisher in 2022)
- Serial Number: IR77/D927A
- Dual-Beam System: Combines high-resolution scanning electron microscope (SEM) and FIB capabilities in one system.
- Resolution: Achieves up to 1.2 nm (electron) and 7 nm (ion) for detailed imaging and precise milling.
- High-Brightness Sources: Equipped with an electron source and gallium liquid-metal ion source, delivering high performance for advanced analysis.
- Flexible Vacuum Modes: Includes Environmental SEM (ESEM) mode, ideal for imaging non-conductive or sensitive samples.
- Gas Injection System: Allows for precision deposition and etching, enhancing material processing applications.
- Motorised 5-Axis Stage: Enables versatile sample positioning and manipulation for detailed examination.
- Carbon Milling Capability: Supports additional milling applications for enhanced sample preparation.
- Digital Imaging Integration: Provides high-quality imaging with upgrade options for extended functionality.
- Ancillary Equipment: Comes with associated power supply, pumps, chiller, and related accessories.
- Ideal Applications: Suitable for high-demand research and industrial analysis across materials science, electronics, and nanotechnology fields.
This FEI Quanta 3D FEG is ideal for detailed imaging, milling, and cross-sectioning, offering comprehensive tools for both research and industrial applications.
For pricing and more information please contact us.
+44 (0)1904 799 900
sales@yps-ltd.com