For Sale: FEI Quanta 3D FEG (2008)
FEI Quanta 3D FEG Scanning Electron Microscope with Focused Ion Beam (FIB) Cross Sectioning Capability.
This system is ideal for detailed imaging, milling, and cross-sectioning, offering comprehensive tools for both research and industrial applications.
Philips XL30 SFEG SEM Scanning Electron Microscope
Philips XL30 SFEG SEM is a field emission SEM which is a fully automatic gun configuration. The magnification is up to 800,000X with 2nm resolution. It is easy to use for examining and survey the morphology of the nano devices.